The objective of this white paper is to specify a standard, how to determine efficiency of AC-
Deviating measurements result either from random or systematic error. Random errors mainly in the device under test (DUT) are caused by unknown and unpredictable parameters like parts tolerances, which can mostly be described by a Gaussian normal distribution. By referring to a reference DUT, random errors can be neglected in this guide.
The focus is on minimizing systematic errors like:
Click here for the white paper
Click HERE for the embedded XLS tool “DVM Range Error”
Click HERE for the embedded XLS tool “Shunt resistor Error”
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